foxBMS-UnitTests  1.0.0
The foxBMS Unit Tests API Documentation
test_mic_plausibility.c
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41 
42 /**
43  * @file test_mic_plausibility.c
44  * @author foxBMS Team
45  * @date 2020-07-13 (date of creation)
46  * @updated 2021-01-15 (date of last update)
47  * @ingroup UNIT_TEST_IMPLEMENTATION
48  * @prefix TEST
49  *
50  * @brief Tests for the mic_plausibility module
51  *
52  */
53 
54 /*========== Includes =======================================================*/
55 #include "unity.h"
56 #include "Mocktsi.h"
57 
58 #include "mic_plausibility.h"
59 #include "test_assert_helper.h"
60 
61 /*========== Definitions and Implementations for Unit Test ==================*/
62 
63 /** generic implementation of cell voltage limits */
64 MIC_PLAUSIBILITY_VALUES_s testGenericLimits = {
65  .maximumPlausibleVoltage_mV = 5000,
66  .minimumPlausibleVoltage_mV = 0,
67 };
68 
69 /** generic implementation of cell voltage limits with negative limits */
70 MIC_PLAUSIBILITY_VALUES_s testGenericLimitsNegative = {
71  .maximumPlausibleVoltage_mV = 5000,
72  .minimumPlausibleVoltage_mV = -5000,
73 };
74 
75 /*========== Setup and Teardown =============================================*/
76 void setUp(void) {
77 }
78 
79 void tearDown(void) {
80 }
81 
82 /*========== Test Cases =====================================================*/
83 
84 /** check sanity-check of voltage plausibility function
85  *
86  * limits may not be the same and must be ascending
87  */
88 void testMIC_PlausibilityCheckVoltageMeasurementRangeLimitSanity(void) {
89  MIC_PLAUSIBILITY_VALUES_s limitsEqualValues = {
90  .maximumPlausibleVoltage_mV = 42,
91  .minimumPlausibleVoltage_mV = 42,
92  };
93 
94  MIC_PLAUSIBILITY_VALUES_s limitsDescendingOrder = {
95  .maximumPlausibleVoltage_mV = INT16_MIN,
96  .minimumPlausibleVoltage_mV = INT16_MAX,
97  };
98 
99  MIC_PLAUSIBILITY_VALUES_s limitsAscendingOrder = {
100  .maximumPlausibleVoltage_mV = INT16_MAX,
101  .minimumPlausibleVoltage_mV = INT16_MIN,
102  };
103 
104  TEST_ASSERT_FAIL_ASSERT(MIC_PlausibilityCheckVoltageMeasurementRange(0, limitsEqualValues));
105  TEST_ASSERT_FAIL_ASSERT(MIC_PlausibilityCheckVoltageMeasurementRange(0, limitsDescendingOrder));
106  TEST_ASSERT_PASS_ASSERT(
107  TEST_ASSERT_EQUAL(STD_OK, MIC_PlausibilityCheckVoltageMeasurementRange(0, limitsAscendingOrder)));
108 }
109 
110 /** equivalence input classes for voltage check:
111  *
112  * cell voltage value:
113  * * in-range-value: e.g. 3500
114  * * out-of-upper-range-value: e.g. INT16_MAX
115  * * out-of-lower-range-value: e.g. INT16_MIN
116  * * just to be sure: 0
117  *
118  * limits:
119  * * negative values
120  * * positive values
121  * * zero
122  */
123 void testMIC_PlausibilityCheckVoltageMeasurementRange(void) {
124  TEST_ASSERT_EQUAL(STD_OK, MIC_PlausibilityCheckVoltageMeasurementRange(3500, testGenericLimits));
125  TEST_ASSERT_EQUAL(STD_NOT_OK, MIC_PlausibilityCheckVoltageMeasurementRange(INT16_MAX, testGenericLimits));
126  TEST_ASSERT_EQUAL(STD_NOT_OK, MIC_PlausibilityCheckVoltageMeasurementRange(INT16_MIN, testGenericLimits));
127  TEST_ASSERT_EQUAL(STD_OK, MIC_PlausibilityCheckVoltageMeasurementRange(0, testGenericLimits));
128 
129  /* test around the upper threshold with #testGenericLimits */
130  TEST_ASSERT_EQUAL(
131  STD_NOT_OK,
132  MIC_PlausibilityCheckVoltageMeasurementRange(
133  testGenericLimits.maximumPlausibleVoltage_mV + 1, testGenericLimits));
134  TEST_ASSERT_EQUAL(
135  STD_OK,
136  MIC_PlausibilityCheckVoltageMeasurementRange(testGenericLimits.maximumPlausibleVoltage_mV, testGenericLimits));
137  TEST_ASSERT_EQUAL(
138  STD_OK,
139  MIC_PlausibilityCheckVoltageMeasurementRange(
140  testGenericLimits.maximumPlausibleVoltage_mV - 1, testGenericLimits));
141 
142  /* test around the lower threshold with #testGenericLimits */
143  TEST_ASSERT_EQUAL(
144  STD_OK,
145  MIC_PlausibilityCheckVoltageMeasurementRange(
146  testGenericLimits.minimumPlausibleVoltage_mV + 1, testGenericLimits));
147  TEST_ASSERT_EQUAL(
148  STD_OK,
149  MIC_PlausibilityCheckVoltageMeasurementRange(testGenericLimits.minimumPlausibleVoltage_mV, testGenericLimits));
150  TEST_ASSERT_EQUAL(
151  STD_NOT_OK,
152  MIC_PlausibilityCheckVoltageMeasurementRange(
153  testGenericLimits.minimumPlausibleVoltage_mV - 1, testGenericLimits));
154 
155  /* test around the upper threshold with #testGenericLimitsNegative */
156  TEST_ASSERT_EQUAL(
157  STD_NOT_OK,
158  MIC_PlausibilityCheckVoltageMeasurementRange(
159  testGenericLimitsNegative.maximumPlausibleVoltage_mV + 1, testGenericLimitsNegative));
160  TEST_ASSERT_EQUAL(
161  STD_OK,
162  MIC_PlausibilityCheckVoltageMeasurementRange(
163  testGenericLimitsNegative.maximumPlausibleVoltage_mV, testGenericLimitsNegative));
164  TEST_ASSERT_EQUAL(
165  STD_OK,
166  MIC_PlausibilityCheckVoltageMeasurementRange(
167  testGenericLimitsNegative.maximumPlausibleVoltage_mV - 1, testGenericLimitsNegative));
168 
169  /* test around the lower threshold with #testGenericLimitsNegative */
170  TEST_ASSERT_EQUAL(
171  STD_OK,
172  MIC_PlausibilityCheckVoltageMeasurementRange(
173  testGenericLimitsNegative.minimumPlausibleVoltage_mV + 1, testGenericLimitsNegative));
174  TEST_ASSERT_EQUAL(
175  STD_OK,
176  MIC_PlausibilityCheckVoltageMeasurementRange(
177  testGenericLimitsNegative.minimumPlausibleVoltage_mV, testGenericLimitsNegative));
178  TEST_ASSERT_EQUAL(
179  STD_NOT_OK,
180  MIC_PlausibilityCheckVoltageMeasurementRange(
181  testGenericLimitsNegative.minimumPlausibleVoltage_mV - 1, testGenericLimitsNegative));
182 }
183 
184 /** check if the function handles bad input from the API as expected */
185 void testMIC_PlausibilityCheckTempMinMaxBadInputFromAPI(void) {
186  TSI_GetMaximumPlausibleTemperature_ExpectAndReturn(50);
187  TSI_GetMinimumPlausibleTemperature_ExpectAndReturn(51);
188  TEST_ASSERT_FAIL_ASSERT(MIC_PlausibilityCheckTempMinMax(0));
189 
190  TSI_GetMaximumPlausibleTemperature_ExpectAndReturn(50);
191  TSI_GetMinimumPlausibleTemperature_ExpectAndReturn(50);
192  TEST_ASSERT_PASS_ASSERT(MIC_PlausibilityCheckTempMinMax(0));
193 
194  TSI_GetMaximumPlausibleTemperature_ExpectAndReturn(-50);
195  TSI_GetMinimumPlausibleTemperature_ExpectAndReturn(-51);
196  TEST_ASSERT_PASS_ASSERT(MIC_PlausibilityCheckTempMinMax(0));
197 
198  TSI_GetMaximumPlausibleTemperature_ExpectAndReturn(51);
199  TSI_GetMinimumPlausibleTemperature_ExpectAndReturn(50);
200  TEST_ASSERT_PASS_ASSERT(MIC_PlausibilityCheckTempMinMax(0));
201 }
202 
203 /** check if the function handles plausible and implausible input as expected
204  equivalence classes:
205  * below lower limit --> FAIL
206  * on lower limit --> PASS
207  * between lower and upper limit --> PASS
208  * on upper limit --> PASS
209  * above upper limit --> FAIL
210  */
211 void testMIC_PlausibilityCheckTempMinMaxVerify(void) {
212  const int16_t upperLimit_ddegC = 100;
213  const int16_t lowerLimit_ddegC = -10;
214  TSI_GetMaximumPlausibleTemperature_IgnoreAndReturn(upperLimit_ddegC);
215  TSI_GetMinimumPlausibleTemperature_IgnoreAndReturn(lowerLimit_ddegC);
216 
217  TEST_ASSERT_EQUAL(STD_NOT_OK, MIC_PlausibilityCheckTempMinMax(INT16_MIN));
218  TEST_ASSERT_EQUAL(STD_NOT_OK, MIC_PlausibilityCheckTempMinMax(lowerLimit_ddegC - 1));
219  TEST_ASSERT_EQUAL(STD_OK, MIC_PlausibilityCheckTempMinMax(lowerLimit_ddegC));
220  TEST_ASSERT_EQUAL(STD_OK, MIC_PlausibilityCheckTempMinMax((lowerLimit_ddegC + upperLimit_ddegC) / 2));
221  TEST_ASSERT_EQUAL(STD_OK, MIC_PlausibilityCheckTempMinMax(upperLimit_ddegC));
222  TEST_ASSERT_EQUAL(STD_NOT_OK, MIC_PlausibilityCheckTempMinMax(upperLimit_ddegC + 1));
223  TEST_ASSERT_EQUAL(STD_NOT_OK, MIC_PlausibilityCheckTempMinMax(INT16_MAX));
224 }
setUp
void setUp(void)
Definition: test_mic_plausibility.c:76
testMIC_PlausibilityCheckVoltageMeasurementRange
void testMIC_PlausibilityCheckVoltageMeasurementRange(void)
Definition: test_mic_plausibility.c:123
test_assert_helper.h
Helper for unit tests.
tearDown
void tearDown(void)
Definition: test_mic_plausibility.c:79
MIC_PLAUSIBILITY_VALUES::maximumPlausibleVoltage_mV
const int16_t maximumPlausibleVoltage_mV
Definition: mic_plausibility.h:72
mic_plausibility.h
plausibility checks for cell voltage and cell temperatures
STD_OK
@ STD_OK
Definition: fstd_types.h:72
testMIC_PlausibilityCheckTempMinMaxVerify
void testMIC_PlausibilityCheckTempMinMaxVerify(void)
Definition: test_mic_plausibility.c:211
MIC_PlausibilityCheckTempMinMax
STD_RETURN_TYPE_e MIC_PlausibilityCheckTempMinMax(const int16_t celltemperature_ddegC)
Cell temperature plausibility check.
Definition: mic_plausibility.c:86
STD_NOT_OK
@ STD_NOT_OK
Definition: fstd_types.h:73
testGenericLimits
MIC_PLAUSIBILITY_VALUES_s testGenericLimits
Definition: test_mic_plausibility.c:64
MIC_PLAUSIBILITY_VALUES::minimumPlausibleVoltage_mV
const int16_t minimumPlausibleVoltage_mV
Definition: mic_plausibility.h:77
MIC_PlausibilityCheckVoltageMeasurementRange
STD_RETURN_TYPE_e MIC_PlausibilityCheckVoltageMeasurementRange(const int16_t cellvoltage_mV, const MIC_PLAUSIBILITY_VALUES_s plausibleValues)
Cell voltage measurement range plausibility check.
Definition: mic_plausibility.c:70
testMIC_PlausibilityCheckVoltageMeasurementRangeLimitSanity
void testMIC_PlausibilityCheckVoltageMeasurementRangeLimitSanity(void)
Definition: test_mic_plausibility.c:88
testMIC_PlausibilityCheckTempMinMaxBadInputFromAPI
void testMIC_PlausibilityCheckTempMinMaxBadInputFromAPI(void)
Definition: test_mic_plausibility.c:185
testGenericLimitsNegative
MIC_PLAUSIBILITY_VALUES_s testGenericLimitsNegative
Definition: test_mic_plausibility.c:70
MIC_PLAUSIBILITY_VALUES
struct definition for plausibility values of a MIC
Definition: mic_plausibility.h:67
TEST_ASSERT_FAIL_ASSERT
#define TEST_ASSERT_FAIL_ASSERT(_code_under_test)
assert whether assert macro has failed
Definition: test_assert_helper.h:70
TEST_ASSERT_PASS_ASSERT
#define TEST_ASSERT_PASS_ASSERT(_code_under_test)
assert whether assert macro has passed
Definition: test_assert_helper.h:88