test_diag_cbs_plausibility.c

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/**
 * @file    test_diag_cbs_plausibility.c
 * @author  foxBMS Team
 * @date    2021-02-17 (date of creation)
 * @updated 2023-02-03 (date of last update)
 * @version v1.5.0
 * @ingroup UNIT_TEST_IMPLEMENTATION
 * @prefix  TEST
 *
 * @brief   Test of the plausibility diag handler implementation.
 *
 */
 
/*========== Includes =======================================================*/
#include "unity.h"
#include "Mockdiag_cfg.h"
 
#include "diag_cbs.h"
#include "test_assert_helper.h"
 
TEST_FILE("diag_cbs_plausibility.c")
 
/*========== Definitions and Implementations for Unit Test ==================*/
/** local copy of the #DATA_BLOCK_ERROR_STATE_s table */
static DATA_BLOCK_ERROR_STATE_s test_tableErrorFlags = {.header.uniqueId = DATA_BLOCK_ID_ERROR_STATE};
 
/** local copy of the #DATA_BLOCK_MOL_FLAG_s table */
static DATA_BLOCK_MOL_FLAG_s test_tableMolFlags = {.header.uniqueId = DATA_BLOCK_ID_MOL_FLAG};
 
/** local copy of the #DATA_BLOCK_RSL_FLAG_s table */
static DATA_BLOCK_RSL_FLAG_s test_tableRslFlags = {.header.uniqueId = DATA_BLOCK_ID_RSL_FLAG};
 
/** local copy of the #DATA_BLOCK_MSL_FLAG_s table */
static DATA_BLOCK_MSL_FLAG_s test_tableMslFlags = {.header.uniqueId = DATA_BLOCK_ID_MSL_FLAG};
 
const DIAG_DATABASE_SHIM_s diag_kpkDatabaseShim = {
    .pTableError = &test_tableErrorFlags,
    .pTableMol   = &test_tableMolFlags,
    .pTableRsl   = &test_tableRslFlags,
    .pTableMsl   = &test_tableMslFlags,
};
 
/*========== Setup and Teardown =============================================*/
void setUp(void) {
}
 
void tearDown(void) {
}
 
/*========== Test Cases =====================================================*/
/** tests invalid input values */
void testDIAG_ErrorPlausibilityInvalidInput(void) {
    TEST_ASSERT_FAIL_ASSERT(DIAG_ErrorPlausibility(DIAG_ID_MAX, DIAG_EVENT_OK, &diag_kpkDatabaseShim, 0u));
    TEST_ASSERT_FAIL_ASSERT(DIAG_ErrorPlausibility(DIAG_ID_PLAUSIBILITY_PACK_VOLTAGE, 42, &diag_kpkDatabaseShim, 0u));
    TEST_ASSERT_FAIL_ASSERT(DIAG_ErrorPlausibility(DIAG_ID_PLAUSIBILITY_PACK_VOLTAGE, DIAG_EVENT_OK, NULL_PTR, 0u));
    TEST_ASSERT_FAIL_ASSERT(DIAG_ErrorPlausibility(
        DIAG_ID_PLAUSIBILITY_PACK_VOLTAGE, DIAG_EVENT_OK, &diag_kpkDatabaseShim, BS_NR_OF_STRINGS));
}
 
/** tests invalid input values */
void testDIAG_PlausibilityCheckInvalidInput(void) {
    TEST_ASSERT_FAIL_ASSERT(DIAG_PlausibilityCheck(DIAG_ID_MAX, DIAG_EVENT_OK, &diag_kpkDatabaseShim, 0u));
    TEST_ASSERT_FAIL_ASSERT(DIAG_PlausibilityCheck(DIAG_ID_PLAUSIBILITY_CELL_VOLTAGE, 42, &diag_kpkDatabaseShim, 0u));
    TEST_ASSERT_FAIL_ASSERT(DIAG_PlausibilityCheck(DIAG_ID_PLAUSIBILITY_CELL_VOLTAGE, DIAG_EVENT_OK, NULL_PTR, 0u));
    TEST_ASSERT_FAIL_ASSERT(DIAG_PlausibilityCheck(
        DIAG_ID_PLAUSIBILITY_CELL_VOLTAGE, DIAG_EVENT_OK, &diag_kpkDatabaseShim, BS_NR_OF_STRINGS));
}