foxBMS - Unit Tests
1.1.0
The foxBMS Unit Tests API Documentation
test_n775.c
Go to the documentation of this file.
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/**
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*
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* @copyright © 2010 - 2021, Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
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*/
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/**
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* @file test_n775.c
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* @author foxBMS Team
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* @date 2020-06-10 (date of creation)
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* @updated 2021-03-24 (date of last update)
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* @ingroup UNIT_TEST_IMPLEMENTATION
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* @prefix TEST
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*
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* @brief Test of the n775.c module
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*
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*/
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/*========== Includes =======================================================*/
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#include "unity.h"
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#include "Mockdatabase.h"
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#include "Mockfassert.h"
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#include "Mockmic.h"
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#include "Mocknxp_mic_dma.h"
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#include "Mockos.h"
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#include "Mockspi.h"
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#include "
n775.h
"
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/*========== Definitions and Implementations for Unit Test ==================*/
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const
spiDAT1_t
spi_kNxp775DataConfig
= {
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/* struct is implemented in the TI HAL and uses uppercase true and false */
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.CS_HOLD = FALSE,
/* The HW chip select signal is deactivated */
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.WDEL = TRUE,
/* No delay will be inserted */
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.DFSEL = SPI_FMT_0,
/* Data word format select */
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.CSNR = 0x0,
/* Chip select (CS) number, 0x01h for CS[0] */
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};
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SPI_INTERFACE_CONFIG_s
spi_nxp775Interface
= {
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.
channel
=
SPI_Interface1
,
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.pConfig = &
spi_kNxp775DataConfig
,
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.pNode = spiREG1,
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.pGioPort = &(spiREG1->PC3),
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.csPin = 2u,
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};
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/*========== Setup and Teardown =============================================*/
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void
setUp
(
void
) {
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}
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void
tearDown
(
void
) {
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}
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/*========== Test Cases =====================================================*/
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void
testDummy
(
void
) {
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}
n775.h
Headers for the driver for the MC33775A monitoring chip.
SPI_Interface1
@ SPI_Interface1
Definition:
spi_cfg.h:99
SPI_INTERFACE_CONFIG
Definition:
spi_cfg.h:107
SPI_INTERFACE_CONFIG::channel
SPI_INTERFACE_e channel
Definition:
spi_cfg.h:108
spi_kNxp775DataConfig
const spiDAT1_t spi_kNxp775DataConfig
Definition:
test_n775.c:66
testDummy
void testDummy(void)
Definition:
test_n775.c:91
spi_nxp775Interface
SPI_INTERFACE_CONFIG_s spi_nxp775Interface
Definition:
test_n775.c:74
setUp
void setUp(void)
Definition:
test_n775.c:83
tearDown
void tearDown(void)
Definition:
test_n775.c:86
tests
unit
app
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mic
nxp
common
test_n775.c
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